J. KĄTCKI : rechercher sur Z-Library

Journal of Materials Science: Materials in Electronics

Année:

2006

Langue:

english

Fichier:

PDF, 143 KB

english, 2006

Electrical characterization of shallow cobalt-silicided junctions

E. Simoen, A. Poyai, C. Claeys, N. Lukyanchikova, M. Petrichuk, N. Garbar, A. Czerwinski, J. Katcki, J. Ratajczak, E. Gaubas

Journal:

Année:

2001

Langue:

english

Fichier:

PDF, 306 KB

english, 2001

Formation of Dislocations in InGaAs/GaAs Heterostructures

J. Katcki, J. Ratajczak, J. Adamczewska, F. Phillipp, N. Y. Jin-Phillipp, K. Regiński, M. Bugajski

Journal:

physica status solidi (a)

Année:

1999

Langue:

english

Fichier:

PDF, 316 KB

english, 1999

Structure of Oxygen - Implanted Silicon Single Crystals Treated at ≥1400 K under High Argon Pressure

A. Misiuk, A. Barcz, J. Ratajczak, J. Katcki, J. Bak-Misiuk, L. Bryja, B. Surma, G. Gawlik

Journal:

Crystal Research and Technology

Année:

2001

Langue:

english

Fichier:

PDF, 636 KB

english, 2001

Separation of image-distortion sources and magnetic-field measurement in scanning electron microscope (SEM)

Mariusz Płuska, Andrzej Czerwinski, Jacek Ratajczak, Jerzy Kątcki, Łukasz Oskwarek, Remigiusz Rak

Journal:

Micron

Année:

2009

Langue:

english

Fichier:

PDF, 307 KB

english, 2009

Selective etching of dislocations in GaN and quantitative SEM analysis with shape-reconstruction method

M. Wzorek, A. Czerwinski, J. Ratajczak, R. Dylewicz, J. Kątcki

Journal:

Micron

Année:

2009

Langue:

english

Fichier:

PDF, 580 KB

english, 2009

TEM study of PtSi contact layers for low Schottky barrier MOSFETs

A. Łaszcz, J. Kątcki, J. Ratajczak, A. Czerwinski, N. Breil, G. Larrieu, E. Dubois

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Année:

2006

Langue:

english

Fichier:

PDF, 379 KB

english, 2006

Nanostructure formation by high temperature–pressure treatment of silicon implanted with hydrogen/helium

A. Misiuk, B. Surma, J. Ratajczak, J. Kątcki, M. Wzorek, A. Barcz, A. Wnuk, J. Jagielski

Journal:

Superlattices and Microstructures

Année:

2004

Langue:

english

Fichier:

PDF, 969 KB

english, 2004

LPE growth and characterisation of GaInAsSb and GaAlAsSb quaternary layers on (100) GaSb substrates

M Piskorski, A Piotrowska, T.T Piotrowski, K Golaszewska, E Papis, J Katcki, J Ratajczak, A Barcz, A Wawro

Journal:

Thin Solid Films

Année:

2004

Langue:

english

Fichier:

PDF, 884 KB

english, 2004

Application of ion implantation for mono-Si piezoresistors manufacturing in silicon MEMS technology

B. Jaroszewicz, K. Domanski, D. Tomaszewski, P. Janus, A. Kudla, B. Latecki, A. Kociubinski, M. Nikodem, J. Katcki, M. Wzorek, J. Marczewski, P. Grabiec

Journal:

Vacuum

Année:

2005

Langue:

english

Fichier:

PDF, 265 KB

english, 2005

Hydrostatic pressure effect on dislocation evolution in self-implanted Si investigated by electron microscopy methods

M. Wzorek, A. Czerwinski, J. Ratajczak, A. Misiuk, J. Kątcki

Journal:

Vacuum

Année:

2007

Langue:

english

Fichier:

PDF, 323 KB

english, 2007

Very low Schottky barrier to n-type silicon with PtEr-stack silicide

Xiaohui Tang, J. Katcki, E. Dubois, N. Reckinger, J. Ratajczak, G. Larrieu, P. Loumaye, O. Nisole, V. Bayot

Journal:

Solid-State Electronics

Année:

2003

Langue:

english

Fichier:

PDF, 183 KB

english, 2003

Sulfide treatment of GaSb surface: influence on the LPE growth of InGaAsSb/AlGaAsSb heterostructures

E Papis, A Piotrowska, E Kamińska, K Gołaszewska, W Jung, J Kątcki, A Kudła, M Piskorski, T.T Piotrowski, J Adamczewska

Journal:

Vacuum

Année:

2000

Langue:

english

Fichier:

PDF, 256 KB

english, 2000

On the influence of point defects in the LOCOS process

J. Katcki, R. Gleichmann, J. Łysko, H. Bartsch

Journal:

physica status solidi (a)

Année:

1987

Langue:

english

Fichier:

PDF, 656 KB

english, 1987

Defect structure in self-implanted silicon annealed under enhanced hydrostatic pressure – electron microscopy study

M. Wzorek, A. Czerwinski, J. Ratajczak, A. Misiuk, B. Surma, J. Kątcki

Journal:

physica status solidi (c)

Année:

2007

Langue:

english

Fichier:

PDF, 305 KB

english, 2007

Transmission electron microscopy study of the platinum germanide formation process in the Ge/Pt/Ge/SiO2/Si structure

A. Łaszcz, J. Ratajczak, A. Czerwinski, J. Kątcki, V. Srot, F. Phillipp, P.A. van Aken, N. Breil, G. Larrieu, E. Dubois

Journal:

Materials Science and Engineering: B

Année:

2008

Langue:

english

Fichier:

PDF, 840 KB

english, 2008

Transmission electron microscopy characterization of the erbium silicide formation process using a Pt/Er stack on a silicon-on-insulator substrate

A. ŁASZCZ, J. KĄTCKI, J. RATAJCZAK, XIAOHUI TANG, E. DUBOIS

Journal:

Année:

2006

Langue:

english

Fichier:

PDF, 129 KB

english, 2006

In situ electron beam induced current measurements of the local thickness in semiconductor devices

A. CZERWINSKI, M. PŁUSKA, J. RATAJCZAK, J. KATCKI

Journal:

Année:

2006

Langue:

english

Fichier:

PDF, 135 KB

english, 2006

Buried amorphous-layer impact on dislocation densities in silicon

M. WZOREK, J. KĄTCKI, M. PŁUSKA, J. RATAJCZAK, B. JAROSZEWICZ, K. DOMAŃSKI, P. GRABIEC

Journal:

Année:

2006

Langue:

english

Fichier:

PDF, 132 KB

english, 2006

Editorial

J. KĄTCKI, A. CZERWINSKI

Journal:

Année:

2006

Langue:

english

Fichier:

PDF, 34 KB

english, 2006

Identification of electron beam vibration sources by separation of magnetic distortion from electric distortion on scanning electron microscope imaging

M. PLUSKA, A. CZERWINSKI, J. RATAJCZAK, J. KĄTCKI, Ł. OSKWAREK, R. RAK

Journal:

Année:

2010

Langue:

english

Fichier:

PDF, 187 KB

english, 2010

Transmission electron microscopy study of erbium silicide formation from Ti/Er stack for Schottky contact applications

J. RATAJCZAK, A. ŁASZCZ, A. CZERWINSKI, J. KĄTCKI, F. PHILLIPP, P.A. VAN AKEN, N. RECKINGER, E. DUBOIS

Journal:

Année:

2010

Langue:

english

Fichier:

PDF, 372 KB

english, 2010

Dependence of cathodoluminescence on layer resistance applied for measurement of thin-layer sheet resistance

A. CZERWINSKI, M. PLUSKA, J. RATAJCZAK, A. SZERLING, J. KąTCKI

Journal:

Année:

2010

Langue:

english

Fichier:

PDF, 176 KB

english, 2010

Depth measurements of etch-pits in GaN with shape reconstruction from SEM images

M. WZOREK, A. CZERWINSKI, J. RATAJCZAK, A. LUI, E. IACOB, J. KĄTCKI

Journal:

Année:

2010

Langue:

english

Fichier:

PDF, 267 KB

english, 2010

Transmission electron microscopy characterization of Au/Pt/Ti/Pt/GaAs ohmic contacts for high power GaAs/InGaAs semiconductor lasers

A. ŁASZCZ, A. CZERWINSKI, J. RATAJCZAK, A. SZERLING, F. PHILLIPP, P.A. VAN AKEN, J. KĄTCKI

Journal:

Année:

2010

Langue:

english

Fichier:

PDF, 354 KB

english, 2010

New approach to cathodoluminescence studies in application to InGaN/GaN laser diode degradation

M. PŁUSKA, A. CZERWINSKI, J. RATAJCZAK, J. KĄTCKI, L. MARONA, R. CZERNECKI, M. LESZCZYŃSKI, P. PERLIN

Journal:

Année:

2009

Langue:

english

Fichier:

PDF, 268 KB

english, 2009

Introduction: Themed issue – Papers Arising from 7th Polish–Japanese Joint Seminar on Micro and Nano Analysis

J. KĄTCKI

Journal:

Central European Journal of Physics

Année:

2009

Langue:

english

Fichier:

PDF, 28 KB

english, 2009

TEM studies of PtSi low Schottky-barrier contacts for source/drain in MOS transistors

Adam Łaszcz, Jacek Ratajczak, Andrzej Czerwinski, Jerzy Kątcki, Nicolas Breil, Guilhem Larrieu, Emmanuel Dubois

Journal:

Année:

2011

Langue:

english

Fichier:

PDF, 1.97 MB

english, 2011

Defect detection in semiconductor layers with built-in electric field with the use of cathodoluminescence

Mariusz Pluska, Andrzej Czerwinski, Jacek Ratajczak, Anna Szerling, Jerzy Kątcki

Journal:

Physica B: Condensed Matter

Année:

2012

Langue:

english

Fichier:

PDF, 550 KB

english, 2012

Effect of uniform stress on silicon implanted with helium, hydrogen and oxygen

A Misiuk, J Bak-Misiuk, I.V Antonova, V Raineri, A Romano-Rodriguez, A Bachrouri, H.B Surma, J Ratajczak, J Katcki, J Adamczewska, E.P Neustroev

Journal:

Computational Materials Science

Année:

2001

Langue:

english

Fichier:

PDF, 556 KB

english, 2001

Tuning InAs/GaAs quantum dot properties under Stranski-Krastanov growth mode for 1.3 Î¼m applications

Chen, J. X., Markus, A., Fiore, A., Oesterle, U., Stanley, R. P., Carlin, J. F., HoudreÌ, R., Ilegems, M., Lazzarini, L., Nasi, L., Todaro, M. T., Piscopiello, E., Cingolani, R., Catalano, M., Katcki

Journal:

Wzorek, Marek, Czerwiński, Andrzej, Kuchuk, Andrian V., Ratajczak, Jacek, Piotrowska, Anna, Kątcki, Jerzy

Année:

2002

Langue:

english

Fichier:

PDF, 741 KB

english, 2002

Ni-Based Ohmic Contacts to Silicon Carbide Examined by Electron Microscopy

Journal:

Année:

2012

Langue:

english

Fichier:

PDF, 988 KB

english, 2012

Formation of platinum-based silicide contacts: Kinetics, stoichiometry, and current drive capabilities

Larrieu, G., Dubois, E., Wallart, X., Baie, X., Katcki, J.

Journal:

Larrieu, Guilhem, Dubois, Emmanuel, Wallart, Xavier, Katcki, Jerzy

Année:

2003

Langue:

english

Fichier:

PDF, 1.19 MB

english, 2003

[IEEE 2006 International Radar Symposium - Krakow, Poland (2006.05.24-2006.05.26)] 2006 International Radar Symposium - Polish Automated System for Air Forces - Polish Way to Introduce Network Enabled Capability

Katcki, Andrzej

Année:

2006

Langue:

english

Fichier:

PDF, 4.80 MB

english, 2006

[ECS 210th ECS Meeting - Cancun, Mexico (October 29-November 3, 2006)] ECS Transactions - Iridium Silicide: a Promising Electrode for Metallic Source/Drain in Decananometer MOSFETs

Année:

2006

Langue:

english

Fichier:

PDF, 248 KB

english, 2006

Observation of radiation defects generated in edge defined film fed growth silicon ribbons under 400 kV irradiation in the high-resolution electron microscope

Katcki, Jerzy, Ast, Dieter

Journal:

Année:

1988

Langue:

english

Fichier:

PDF, 1.22 MB

english, 1988

Accurate extraction of the diffusion current in silicon p-n junction diodes

E. Simoen, C. Claeys, A. Czerwinski, J. Katcki

Année:

1998

Langue:

english

Fichier:

PDF, 329 KB

english, 1998

Kinetics, stoichiometry, morphology, and current drive capabilities of Ir-based silicides

Larrieu, G., Dubois, E., Wallart, X., Katcki, J.

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Année:

2007

Langue:

english

Fichier:

PDF, 795 KB

english, 2007

Electrically injected InGaAs/GaAs quantum-dot microcavity light-emitting diode operating at 1.3 μm and grown by metalorganic chemical vapor deposition

Tasco, V., Todaro, M. T., De Vittorio, M., De Giorgi, M., Cingolani, R., Passaseo, A., Ratajczak, J., Katcki, J. W.

Journal:

Applied Physics Letters

Année:

2004

Langue:

english

Fichier:

PDF, 304 KB

english, 2004

Electrical and Transmission Electron Microscopy Characterisation of 4H-SiC Homoepitaxial Mesa Diodes

Czerwinski, A., Ratajczak, Jacek, Katcki, J., Bakowski, A., Bakowski, Mietek

Journal:

Materials Science Forum

Année:

1998

Fichier:

PDF, 446 KB

1998

Identification and reduction of acoustic-noise influence on focused ion beam (FIB)

Pluska, M., Czerwinski, A., Wzorek, M., Juchniewicz, M., Kątcki, J.

Journal:

Année:

2015

Langue:

english

Fichier:

PDF, 1.20 MB

english, 2015

Study of Oxides Formed in HfO2/Si Structure for High-k Dielectric Applications

Łaszcz, Adam, Czerwiński, Andrzej, Ratajczak, Jacek, Taube, Andrzej, Gierałtowska, Sylwia, Piotrowska, Anna, Kątcki, Jerzy

Journal:

Płuska, Mariusz, Czerwiński, Andrzej, Ratajczak, Jacek, Szerling, Anna, Kątcki, Jerzy

Année:

2012

Langue:

english

Fichier:

PDF, 3.01 MB

english, 2012

Cathodoluminescence and Electroluminescence of Semiconductor Structures in SEM

Journal:

Wzorek, Marek, Czerwiński, Andrzej, Ratajczak, Jacek, Borysiewicz, Michał A., Kuchuk, Andrian V., Piotrowska, Anna, Kątcki, Jerzy

Année:

2012

Langue:

english

Fichier:

PDF, 500 KB

english, 2012

Microstructure Characterization of Si/Ni Contact Layers on n-Type 4H-SiC by TEM and XEDS

Journal:

Materials Science Forum

Année:

2014

Langue:

english

Fichier:

PDF, 480 KB

english, 2014

Fabrication of GaSb Microlenses by Photo and E-Beam Lithography and Dry Etching

Papis, E., Piotrowska, Anna, Piotrowski, T.T., Gołaszewska, K., Ilka, L., Kruszka, R., Ratajczak, Jacek, Kątcki, J., Wróbel, J., Aleszkiewicz, M., Łukaskiewicz, R.

Journal: